Испытания, надежность и качество РЭС

Springer, 2019. — 394 р. — ISBN: 978-3-319-98116-1. This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how...