Stanisavljević M. et al. Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures

Springer, 2014. — 222 p. — ISBN-13 : 978-1489982544This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.