Joester M. et al. Generic IC EMC Test Specification

ZVEI: Electronic Components and Systems Division, Based on BISS Version 1.2 of November 2007, 2010. - 78p.
The document is the technical basis to define common tests characterising the EMC behaviour of Integrated Circuits (ICs) in terms of RF emission and immunity in the frequency range from 150 kHz to 1GHz. It contains all information to evaluate any kind of ICs in the same way. In this document general information and definitions of IC types, pin types, test and measurement networks, pin selection, operation modes and limit classes are given. This allows the user to create an EMC specification for a dedicated IC as well as to provide comparable results for comparable ICs.