Modeling the Space Radiation Environment and Effects on Microelectronic Devices and Circuits

2006 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2006). Short Course Notebook. — Ponte Vedra Beach, Florida: Institute of Electrical and Electronic Engineers, 2006 July 17. — 258 p.This one-day Short Course will provide a detailed discussion of the methods used by radiation effects engineers to model the space radiation environment and some of its effects on modern devices and circuits. The remarkable advances in modern device technology offers specific challenges for high-fidelity radiation effects modeling. These include the need for improved modeling of the variability of the space radiation environment, the transport of the environment through spacecraft structures and chip packaging, and detailed single event effects modeling at the device and circuit level.
Four talks on different aspects of the problem will be presented.
The first talk will be given by Mike Xapsos, NASA expert in radiation environment modeling, and will focus on methods used to predict the space radiation environment.
The second talk of the morning, given by Giovanni Santin, ESA expert in radiation transport, will focus on modeling the basic interactions of radiation with matter.
The afternoon session will provide two talks focused on Single Event Effects (SEE) modeling. The first one will focus on the use of Technology Computer Aided Design (TCAD) tools, and will be given by Mark Law, leader in TCAD tool development.
Jeff Black, Senior Engineer at the Institute for Space and Defense Electronics, will present the last talk of the day on modeling SEEs in integrated circuits.
Each attendee will receive a complimentary CD-ROM that contains an archive of IEEE Nuclear and Space Radiation Effects Conference (NSREC) Short Course Notebooks (1980-2006). This collection covers 27 years of one-day tutorial courses, presented yearly at NSREC. It serves as a valuable reference for students, engineers, and scientists.