Pryds N., Esposito V. (ed.) Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena

Elsevier Inc., 2018. — 562 p. — (The Metal Oxides Book Series). — ISBN: 978-0-12-811166-6.Metal Oxide-Based Thin Film Structures: Formation, Characterization and Application of Interface-Based Phenomena bridges the gap between thin film deposition and device development by exploring the synthesis, properties and applications of thin film interfaces.
Part I deals with theoretical and experimental aspects of epitaxial growth, the structure and morphology of oxide-metal interfaces deposited with different deposition techniques and new developments in growth methods. Part II concerns analysis techniques for the electrical, optical, magnetic and structural properties of thin film interfaces. In Part III, the emphasis is on ionic and electronic transport at the interfaces of Metal-oxide thin films.
Part IV discusses methods for tailoring metal oxide thin film interfaces for specific applications, including microelectronics, communication, optical electronics, catalysis, and energy generation and conservation.
This book is an essential resource for anyone seeking to further their knowledge of metal oxide thin films and interfaces, including scientists and engineers working on electronic devices and energy systems and those engaged in research into electronic materials.Interface formation: Theoretical aspect in epitaxial growth mechanisms, structural features and defects formation
Epitaxy of 5d transition metal oxide thin films and heterostructures
Oxide superlattices by PLD: A practical guide
Oxide molecular beam epitaxy of complex oxide heterointerfaces
Electrochemical ionic interfaces
Experimental: Structural and compositional characterization techniques of metal oxides interfaces
In situ stress measurements of metal oxide thin films
Plume characterization in pulsed laser deposition of metal oxide thin films
Photoemission of buried metal oxide interfaces
Functional material properties of oxide thin films probed by atomic force microscopy on the nanoscale
Controlled atmosphere high-temperature scanning probe microscopy (CAHT-SPM)
Scanning SQUID measurements of oxide interfaces
Modeling and properties at the metal oxide interfaces
First-principle study of metal oxide thin films: Electronic and magnetic properties of confined d electrons
Computational study of energy materials
High-mobility two-dimensional electron gases at complex oxide interfaces
Strain and interfaces for metal oxide-based memristive devices
Applications of metal oxide interfaces
Metal oxide thin film-based low-temperature-operating solid oxide fuel cell by interface structure control
Ionic conductivity of metal oxides: An essential property for all-solid-state lithium-ion batteries
Nanoionics and interfaces for energy and information technologies
Future emerging technologies based on metal oxide interfaces
Ferroelectric and piezoelectric oxide nanostructured films for energy harvesting applications
Redox-based memristive metal-oxide devices