Rebohle L., Skorupa W. Rare-Earth Implanted MOS Devices for Silicon Photonics: Microstructural, Electrical and Optoelectronic Properties

Springer, 2010. — 185 p. — (Springer Series in Materials Science). — ISBN: 978-3-642-14447-9.Summarizes the current knowledge in implanted rare earth materials.
Includes structural microelectric device aspects.
Serves as an ideal reference work for researchers and engineers alike.
The book concentrates on the microstructural, electric and optoelectronic properties of rare-earth implanted MOS structures and their use as light emitters in potential applications. It describes the structural formation processes in the gate oxide during fabrication and under operation, how this microstructure development will affect the electrical device performance and how both microstructure and electrical characteristics determine the optoelectronic features of the light emitters. However, most of the discussed physical processes as well as the described fabrication methods and device characterization techniques are of general interest and are beyond the scope of this type of light emitter.
The book will be of value to engineers, physicists, and scientists dealing either with Si based photonics in particular or optoelectronic device fabrication and characterization in general.Silicon-Based Light Emission
Microstructure
Electrical Properties
Electroluminescence Spectra
Electroluminescence Efficiency
Stability and Degradation
Applications.