Hurst S.L. VLSI Testing: digital and mixed analogue/digital techniques

The Institution of Electrical Engineers, 1998. — 549 p. — (IEE Circuits, Devices and System Series). — ISBN: 0-85296-901-5.A comprehensive introduction and reference for all aspects of IC testing, this book includes all of the basic concepts and theories necessary for advanced students, from practical test strategies and industrial practice, to the economic and managerial aspects of testing.Faults in digital circuits
Digital test pattern generation
Signatures and self test
Structured design for testability (DFT) techniques
Testing of structured digital circuits and microprocessors
Analogue testing
Mixed analogue/digital system test
The economics of test and final overall summary.