Wallis T.M., Kabos P. Measurement Techniques for Radio Frequency Nanoelectronics

Cambridge University Press, 2017. — 320 p. — (The Cambridge RF and Microwave Engineering Series) — ISBN: 1107120683.Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials
Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.An Introduction to Radio Frequency Nanoelectronics
Core Concepts of Microwave and RF Measurements
Extreme Impedance Measurements
On- Wafer Measurements of RF Nanoelectronic Devices
Modeling and Validation of RF Nanoelectronic Devices
Characterization of Nanoiber Devices
Instrumentation for Near- Field Scanning Microwave Microscopy
Probe- Based Measurement Systems
Radio Frequency Scanning Probe Measurements of Materials
Measurement of Active Nanoelectronic Devices
Dopant Proiling in Semiconductor Nanoelectronics
Depth Proiling
Dynamics of Nanoscale Magnetic Systems
Nanoscale Electromagnetic Measurements for Life Science Applications