Bhushan Manjul, Ketchen Mark B. (eds.) CMOS Test and Evaluation: A Physical Perspective

New York: Springer, 2015. — 431 p.CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.Simplicity in Complexity.
CMOS Design and Test Overview.
Tests Types and Timelines.
Test Economics.
Future Test Challenges.
Silicon Technology and Models.
Data Analysis and Characterization.
Scope of the Book.
Summary and Exercises.CMOS Circuits Basics.
Circuit Components and Building Blocks.
SPICE Simulations.
Summary and Exercises.CMOS Storage Elements and Synchronous Logic.
CMOS Chip Overview.
Sequential Logic and Clocked Storage Elements.
Memory.
Circuit Simulations.
Summary and Exercises.IDDQ and Power.
Silicon Technology Scaling and Power.
IDDQ.
Power.
Total Power.
Power Management.
Summary and Exercises.Embedded PVT Monitors.
Placement and Integration.
Silicon Process Monitors.
Power Supply Voltage and Noise Monitors.
Critical Path Monitors.
Temperature Monitors.
Circuit Stages for ROs and Delay Chains.
Data Collection and Characterization.
Summary and Exercises.Variability.
Sources and Impact of Variations.
Variability Characterization.
Minimizing Variations.
Accommodating Variability in Circuit Design.
Summary and Exercises.Electrical Tests and Characterization in Manufacturing.
Digital CMOS Chip Tests.
Yield.
Failure Analysis.
Product Chip Characterization.
Adaptive Testing and Binning.
Summary and Exercises.Reliability.
Reliability and End-of-Life.
CMOS Circuit Performance Degradation Mechanisms.
Managing Reliability.
Summary and Exercises.Basic Statistics and Data Visualization.
Basic Statistics.
Data Filtering, Correlation, and Regression.
Statistical Variations.
Bayesian Statistics.
Data Visualization.
Summary and Exercises.CMOS Metrics and Model Evaluation.
Measurement Standards.
Scaling Trends in CMOS Products.
CMOS Performance Metrics.
CMOS Power-Performance-Density Metrics.
Compact Models and EDA Tool Evaluation.
PD-SOI vs. Bulk Silicon Technology.
Closing Comments on CMOS Technology Evaluation.
Summary and Exercises.Appendixes:
MOSFET and Logic Gate Parameters (PTM HP Models).
BSIM4 PTM Models.