Tehranipoor M., Peng K., Chakrabarty K. Test and Diagnosis for Small-Delay Defects

Springer, 2011. — xviii, 212 p. — ISBN: 978-1-4419-8297-1.This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.From Preface:
This book presents new techniques and methodologies to improve overall SDD detection with very small pattern sets. Based on implementations of these procedures on both academic and industrial circuits, these methods can result in pattern counts as low as a traditional 1-detect pattern set and long path sensitization and SDD detection similar to or even better than n-detect or timing-aware pattern sets. The important design parameters and pattern-induced noises such as process variations, PSN, and crosstalk are taken into account in the proposed methodologies. A diagnostic flow is also presented to identify whether the failure is caused by PSN, crosstalk, or a combination of these two effects.