Liou J.J. (ed.) Electrostatic Discharge Protection: Advances and Applications

New York: CRC Press, 2015. — xvi, 304 p. — (Devices, circuits and systems). — ISBN13: 978-1-4822-5589-8, ISBN10: 1482255898.Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the ESD stresses is a high priority in the semiconductor industry.
Electrostatic Discharge Protection: Advances and Applications delivers timely coverage of component- and system-level ESD protection for semiconductor devices and integrated circuits. Bringing together contributions from internationally respected researchers and engineers with expertise in ESD design, optimization, modeling, simulation, and characterization, this book bridges the gap between theory and practice to offer valuable insight into the state of the art of ESD protection.
Amply illustrated with tables, figures, and case studies, the text:
Instills a deeper understanding of ESD events and ESD protection design principles;
Examines vital processes including Si CMOS, Si BCD, Si SOI, and GaN technologies;
Addresses important aspects pertinent to the modeling and simulation of ESD protection solutions.
Electrostatic Discharge Protection: Advances and Applications provides a single source for cutting-edge information vital to the research and development of effective, robust ESD protection solutions for semiconductor devices and integrated circuits.Editors.Introduction to Electrostatic Discharge Protection. Juin J. Liou.
Design of Component-Level On-Chip ESD Protection for Integrated Circuits. Charvaka Duvvury.
ESD and EOS: Failure Mechanisms and Reliability. Nathaniel Peachey and Kevin Mello.
ESD, EOS, and Latch-Up Test Methods and Associated Reliability Concerns. Alan W. Righter.
Design of Power-Rail ESD Clamp Circuits with Gate-Leakage Consideration in Nanoscale CMOS Technology. Ming-Dou Ker and Chih-Ting Yeh.
ESD Protection in Automotive Integrated Circuit Applications. Javier A. Salcedo and Jean-Jacques Hajjar.
ESD Sensitivity of GaN-Based Electronic Devices. Gaudenzio Meneghesso, Matteo Meneghini, and Enrico Zanoni.
ESD Protection Circuits Using NMOS Parasitic Bipolar Transistor. Teruo Suzuki.
ESD Development in Foundry Processes. Jim Vinson.
Compact Modeling of Semiconductor Devices for Electrostatic Discharge Protection Applications. Zhenghao Gan and Waisum Wong.
Advanced TCAD Methods for System-Level ESD Design. Vladislav A. Vashchenko and Andrei A. Shibkov.
ESD Protection of Failsafe and Voltage-Tolerant Signal Pins. David L. Catlett, Jr., Roger A. Cline, and Ponnarith Pok.
ESD Design and Optimization in Advanced CMOS SOI Technology. You Li.