Cambridge University Press, 2013. — 244 p. — ISBN10: 1107004616. — ISBN13: 978-1107004610.
From typical metrology parameters for common wireless and microwave components to the implementation of measurement benches, this introduction to metrology contains all the key information on the subject.
Using it, readers will be able to:
Interpret and measure most of the parameters described in a microwave component's datasheet
Understand the practical limitations and theoretical principles of instrument operation
Combine several instruments into measurement benches for measuring microwave and wireless quantities.
Several practical examples are included, demonstrating how to measure intermodulation distortion, error vector magnitude, S-parameters and large signal waveforms. Each chapter then ends with a set of exercises, allowing readers to test their understanding of the material covered and making the book equally suited for course use and for self-study.
Measurement of wireless transceivers.
Linear two-port networks.
Linear FOMs.
Nonlinear two-port networks.
Nonlinear FOMs.
System-level FOMs.
Filters.
Amplifiers.
Mixers.
Oscillators.
Frequency-multiplier FOMs.
Digital converters.
Problems.
Instrumentation for wireless systems.
Power meters.
Spectrum analyzers.
Vector signal analyzers.
Real-time signal analyzers.
Vector network analyzers.
Nonlinear vector network analyzers.
Oscilloscopes.
Logic analyzers.
Noise-figure measurement.
Problems.
Signal excitation.
One-tone excitation.
Two-tone excitation.
Two-tone generation mechanisms.
Digitally modulated signals.
Chirp signals.
Comb generators.
Pulse generators.
Problems.
Test benches for wireless system characterization and modeling.
Test benches for characterization.
Test benches for behavioral modeling.
Problems.