Зарегистрироваться
Восстановить пароль
FAQ по входу

Fahrner W.R. (Ed.) Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques

  • Файл формата pdf
  • размером 6,26 МБ
  • Добавлен пользователем
  • Описание отредактировано
Fahrner W.R. (Ed.) Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques
Springer, 2005. — 277 p.
This book provides a concise and didactically structured presentation of nanotechnology as matters stand. Both students and engineers can gain valuable insights into the historical development, production, and characterization procedures of structures in the nanometer range, their electrical applications, measuring procedures for the determination of nanodefect, nanolayer, and nanoparticle characteristics, and the major techniques of preparation in nanotechnology. Based on known facts, an evaluation of nanotechnology, its further development, and its future prospects are attempted.
Historic Development
Quantum Mechanical Aspects
Nanodefects
Nanolayers
Nanoparticles
Selected Solid States with Nanocrystalline Structures
Nanostructuring
Extension of Conventional Devices by Nanotechniques
Innovative Electronic Devices based on Nanostructures.
  • Чтобы скачать этот файл зарегистрируйтесь и/или войдите на сайт используя форму сверху.
  • Регистрация